Labsphere Gains NVLAP ISO 17025 Accreditation

Labsphere Accreditation

January 2012: Pro-Lite partners Labsphere have gained accreditation as a NVLAP ISO 17025 calibration laboratory. The National Institute of Standards and Technology (NIST) governs the United State's National Voluntary Laboratory Accreditation Program (NVLAP). Labsphere’s accreditation as NVLAP Lab 200951-0 was granted following successful completion of rigorous on-site assessments and technical evaluations of the company’s optical calibration lab.

NVLAP accreditation signifies that Labsphere operates in accordance with stringent guidelines pertaining to quality systems, engineering expertise, technical personnel, test and calibration methods, laboratory equipment and environment, measurement traceability, handling of test and calibration items, and accuracy in test and calibration reports.

Dr. Peter Weitzman, Labsphere’s Senior VP Sales/Marketing, remarked that "Labsphere’s NVLAP accreditation validates its reputation as a world class provider of NIST-traceable optical calibrations. Customers worldwide relying on high quality Labsphere solutions can be confident that the calibration of those systems has been performed in our accredited ISO 17205 calibration facility."

Accreditation requirements are established in accordance with the U.S. Code of Federal Regulations (CFR, Title 15, Part 285) and accreditation is granted to a select few laboratories. Labsphere is accredited to perform calibrations, at specified ranges and uncertainties, covering more than eighty parameters. To become accredited, laboratories must meet the requirements set forth in NIST Handbook 150, 'NVLAP Procedures and General Requirements.'

Pro-Lite has served as Labsphere's UK distributor since 2002. Labsphere, Inc. is headquartered in North Sutton, New Hampshire, USA. Founded in 1979, Labsphere is part of the Halma plc group of companies. Labsphere specialices in the design and manufacture of high-end light measurement solutions for the LED/SSL lighting industry, uniform sources for remote sensing and imager calibration, optical coatings and materials, and instrumentation and reflectance standards for spectroscopy applications.